Design of V-shaped cantilevers for enhanced multifrequency AFM measurements

• Mehrnoosh Damircheli and
• Babak Eslami

Beilstein J. Nanotechnol. 2020, 11, 1525–1541, doi:10.3762/bjnano.11.135

• ratios of higher eigenmodes to the fundamental one can be crucial in selecting and designing the optimum cantilever for bimodal AFM imaging. After finding the relationship between parameters of higher eigenmodes and those of the fundamental one, we have studied the effect of the width b on the maximum

• eigenmode is sufficiently high, V-shaped cantilevers can be potentially a better selection for bimodal AFM imaging. Additionally, it is found that for values near 30 µm, the frequency ratio is 5.04 which is close to the whole number 5. This can be advantageous since it was shown that when the second

• compared with the MULTI75G cantilever. Table 6 provides the specification of these cantilevers. Before performing bimodal AFM imaging, another simulation study using the abovementioned numerical code was carried out to compare the theoretical response of the above three models of cantilevers while

Analysis and modification of defective surface aggregates on PCDTBT:PCBM solar cell blends using combined Kelvin probe, conductive and bimodal atomic force microscopy

• Hanaul Noh,
• Alfredo J. Diaz and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2017, 8, 579–589, doi:10.3762/bjnano.8.62

• . Note that in (e)–(h) the dominant carrier behavior is shown in red (and listed in the graph titles) and the minority carrier behavior is shown in green. Notice also the large differences in the scale of the vertical axes in (e)–(h). Removal of surface aggregates during consecutive bimodal AFM imaging

High-bandwidth multimode self-sensing in bimodal atomic force microscopy

• Michael G. Ruppert and
• S. O. Reza Moheimani

Beilstein J. Nanotechnol. 2016, 7, 284–295, doi:10.3762/bjnano.7.26

• strain sensitivity on the fifth eigenmode leading to a remarkable signal-to-noise ratio. Experimental results using bimodal AFM imaging on a two component polymer sample validate that the self-sensing scheme can therefore be used to provide both the feedback signal, for topography imaging on the

A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy

• Santiago D. Solares

Beilstein J. Nanotechnol. 2015, 6, 2233–2241, doi:10.3762/bjnano.6.229

• interacting with a cavity on the surface with respect to a tip interacting with a flat surface; (d) typical Q3D force curves for bimodal AFM imaging using the first and third eigenmodes. Note that the level of indentation increases as A3 increases. Note also the resemblance to the force curve shown in Figure

High-frequency multimodal atomic force microscopy

• Adrian P. Nievergelt,
• Jonathan D. Adams,
• Pascal D. Odermatt and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255

• far remained the domain of a handful of highly-specialized instruments. In this report, we present high-resonance-frequency bimodal AFM imaging by using an AFM readout head designed for high-frequency drive and readout of small cantilevers. Our head is compatible with the Bruker MultiMode AFM, a

• /. d) Thermal noise peak of the second flexural mode of a FastScan A at 6.6 MHz. Bimodal AFM imaging of a PS/PMMA polymer blend with small, high-frequency cantilevers in both air (panels a–c) and water (panels d–f). Panels a and c show topography based on amplitude modulation of the fundamental

Challenges and complexities of multifrequency atomic force microscopy in liquid environments

• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 298–307, doi:10.3762/bjnano.5.33

• imaging conditions and to properly interpret the results, and no single recipe works in all cases. This paper explores through simulation the implications of the low-Q cantilever dynamics within the specific context of bimodal AFM imaging. The primary focus is on (i) the amplitude and phase “relaxation

Repulsive bimodal atomic force microscopy on polymers

• Alexander M. Gigler,
• Christian Dietz,
• Maximilian Baumann,
• Nicolás F. Martinez,
• Ricardo García and
• Robert W. Stark

Beilstein J. Nanotechnol. 2012, 3, 456–463, doi:10.3762/bjnano.3.52

• magnitude smaller than the first two fundamental eigenmodes. Thus, repulsive bimodal imaging of polymer surfaces yields a good signal quality for amplitude ratios smaller than A01/A02 = 10:1 without affecting the topography feedback. Keywords: bimodal AFM imaging; diblock copolymer; polybutadiene

• magnitude. Thus, we conclude that stable imaging with only minimal nonlinear effects is possible for gentle imaging conditions in the repulsive regime. Conclusion Bimodal AFM imaging is fully compatible with repulsive operation. We found that the first-eigenmode image quality in the repulsive regime is not